1672-9722
2015 Issue 1
Calibration Method of Thermal Resistance Tester Based on Electrical Method
ZHAI Yuwei;,ZHENG Shiqi;,CHENG Xiaohui;,LI Yinghui;
ZHAI Yuwei;,ZHENG Shiqi;,CHENG Xiaohui;,LI Yinghui;
..............page:1-3,149
Whole Calibration Method of High-precision Noise Coefficient Measurement System
WU Aihua;,SUN Jing;,LIU Chen;,LIANG Faguo;,ZHENG Yanqiu;
WU Aihua;,SUN Jing;,LIU Chen;,LIANG Faguo;,ZHENG Yanqiu;
..............page:4-6,28
Calibration Method Research on Electronic Component Solderability Tester
MA Qingtao;,ZHANG Ji;,YANG Cheng;,PAN Lingyu;
MA Qingtao;,ZHANG Ji;,YANG Cheng;,PAN Lingyu;
..............page:7-9,79
Architecture Design of Mixed Signal Integrated Circuit Test System Calibration Equipment
LI Xuanmian;,LIU Qian;,HU Yong;
LI Xuanmian;,LIU Qian;,HU Yong;
..............page:10-13,35
Design and Characterization on Reference Materials of Digital Integrate Circuit
HU Yong;,LIU Qian;,ZHOU Houping;
HU Yong;,LIU Qian;,ZHOU Houping;
..............page:14-16,154
Micro-current Calibration Method of the Semi-conductor Analyzer
QIAO Yu'e;,ZHENG Shiqi;,LIANG Faguo;,DING Liqiang;
QIAO Yu'e;,ZHENG Shiqi;,LIANG Faguo;,DING Liqiang;
..............page:17-20,43
Special TRL Standards for Monolithic Transistors Modeling
LIU Chen;,SUN Jing;,WU Aihua;,LUAN Peng;,ZHENG Yanqiu;,LIANG Faguo;
LIU Chen;,SUN Jing;,WU Aihua;,LUAN Peng;,ZHENG Yanqiu;,LIANG Faguo;
..............page:21-23,74
Uncertainty Evaluation of the Noise-Parameter Measurement with Monte Carlo Method
ZHENG Shiqi;,WU Aihua;,LIANG Faguo;
ZHENG Shiqi;,WU Aihua;,LIANG Faguo;
..............page:24-28
Automated Calibration Program Design of Overall Timing Accuracy of Automated Test Equipments
LIU Qian;,HU Yong;,LI Xuanmian;
LIU Qian;,HU Yong;,LI Xuanmian;
..............page:29-31,69
..............page:32-35
..............page:36-38,132
Evaluation of Measurement Uncertainty for S-parameters Based on SOLT Calibration Technology
HAN Zhiguo;,LIANG Faguo;,LUAN Peng;,WU Aihua;,LI Suoyin;
HAN Zhiguo;,LIANG Faguo;,LUAN Peng;,WU Aihua;,LI Suoyin;
..............page:39-43
A High Accuracy Calibration Method of Picoampere and Nanoampere DC Current
WANG Yibang;,ZHENG Shiqi;,WU Aihua;,FU Shaohui;
WANG Yibang;,ZHENG Shiqi;,WU Aihua;,FU Shaohui;
..............page:44-46
The Scheme of On-wafer Vector Network Analyzer Test System Comparison of Values
SUN Xiaoying;,SUN Jing;,LUAN Peng;,WU Aihua;,HAN Lihua;,LIANG Faguo;
SUN Xiaoying;,SUN Jing;,LUAN Peng;,WU Aihua;,HAN Lihua;,LIANG Faguo;
..............page:47-50,58
An Semi-automatic Calibration System for DC Power Supplies
LIU Yan;,DING Liqiang;,QIAO Yu'e;,WU Aihua;
LIU Yan;,DING Liqiang;,QIAO Yu'e;,WU Aihua;
..............page:51-53
Evaluation of Uncertainty of Measurement of BC3193 Test Systems
ZHANG Jianhong;
ZHANG Jianhong;
..............page:54-58
A Configuration Method of FPGA Interconnect Resources Testing
WANG Xiangfen;,GAO Cheng;,HUANG Jiaoying;,FU Chengcheng;
WANG Xiangfen;,GAO Cheng;,HUANG Jiaoying;,FU Chengcheng;
..............page:59-64
ban quan sheng ming
ji suan ji yu shu zi gong cheng bian ji bu ;
ji suan ji yu shu zi gong cheng bian ji bu ;
..............page:64-64
Research on Testing Technology of Logic Elements in FPGA
QIU Yunfeng;,QIN Ludong;
QIU Yunfeng;,QIN Ludong;
..............page:65-69
Direct-Digital-Synthesis Dedicated Silicon Static Parameter Testing Method
LIU Luyang;,ZHANG Hong;,ZHANG Bei;,LV Bing;
LIU Luyang;,ZHANG Hong;,ZHANG Bei;,LV Bing;
..............page:70-74
Research of Delay-Fault Testing Technology in FPGA
YANG Shining;,GU Ying;,SHI Xuemei;
YANG Shining;,GU Ying;,SHI Xuemei;
..............page:75-79
FPGA Device Test Scheme Based on ATE
JIAO Yatao;,GU Ying;,SHI Xuemei;
JIAO Yatao;,GU Ying;,SHI Xuemei;
..............page:80-82
Test Method of Dual Port Static RAM
LI Shengjie;,ZHANG Bei;,GU Ying;
LI Shengjie;,ZHANG Bei;,GU Ying;
..............page:83-86,112
Test Method of Typical Parameters of ADCs Based on Current Integration Method
CHEN Bo;,ZHANG Hong;,ZHANG Bei;
CHEN Bo;,ZHANG Hong;,ZHANG Bei;
..............page:87-90,109
High-power Motor Controller and Driver Testing Device
YUAN Wen;,QIU Yunfeng;,ZHANG Wenhui;
YUAN Wen;,QIU Yunfeng;,ZHANG Wenhui;
..............page:91-96
Testing Technology of Isolation Amplifier
QIU Yunfeng;,ZHANG Shiyan;
QIU Yunfeng;,ZHANG Shiyan;
..............page:97-99,123
Voltage Regulator Output Adjustment Module Base on the Switch Array
LEI Yun;,LU Dinghong;,LI Yuxue;
LEI Yun;,LU Dinghong;,LI Yuxue;
..............page:100-102,127
Test Technology for AT89 Series MCU
SONG Fang;,JIAN Li;
SONG Fang;,JIAN Li;
..............page:103-105,141
EMI Filter Testing Technology
JIAN Li;,SONG Fang;
JIAN Li;,SONG Fang;
..............page:106-109
1-Wire Chip Test Method Based on ATE
SUN Chongjun;
SUN Chongjun;
..............page:110-112
A FLEX Series FPGA Test Modeling Scheme
ZHANG Jun;,YUAN Yunhua;
ZHANG Jun;,YUAN Yunhua;
..............page:113-116,136
Shell Temperature Controlling Method for High Power DC/DC Module at Full Power State
MEI Liang;,ZHANG Hong;,ZHANG Bei;,CHANG Cheng;
MEI Liang;,ZHANG Hong;,ZHANG Bei;,CHANG Cheng;
..............page:117-120,158
Discuss of SAM Technique and Standard of PEM
LONG Chengwu;,GUAN Mingxin;,LIU Li;
LONG Chengwu;,GUAN Mingxin;,LIU Li;
..............page:121-123
Application of Acoustic Scanning Technology in Semiconductor Industry
PAN Lingyu;,ZHANG Ji;
PAN Lingyu;,ZHANG Ji;
..............page:124-127
The Accelerated Storage Life Method of Switch Power Supply
ZHAO Yongxing;
ZHAO Yongxing;
..............page:128-132
Application of Micro Infrared Thermal Imaging Technology in Fault Location
LIU Xiamei;,ZHAI Yuwei;,WU Aihua;,QIAO Yu'e;
LIU Xiamei;,ZHAI Yuwei;,WU Aihua;,QIAO Yu'e;
..............page:133-136
Science Behind Sample Preparation Technology
YANG Cheng;
YANG Cheng;
..............page:137-141
Confirmation Method of the Test Ability of Electric Vibration Tables
LI Yuling;,YANG Zhiwen;
LI Yuling;,YANG Zhiwen;
..............page:142-145
..............page:146-149
..............page:150-154
Parameter Changes of Electron Components Based on Temperature Variation
LEI Yun;,QIU Yunfeng;
LEI Yun;,QIU Yunfeng;
..............page:155-158