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Safety & EMC
1005-9776
2013 Issue 3
Exploration and Solutions of EMC Testing Failure of Electronic Products
huang man xue
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page:92-95
China Automotive Technology & Research Center EMC Laboratory
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page:108
Analysis of Electromagnetic Disturbance Caused by High-intensity Gas-discharge Headlamp
wang tie cheng ; qian rui ; ding yi fu
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page:83-85
2012 IEEE International Symposium on EMC——Transportation System & Smart Grid
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page:97-101
kai chuang dian ci jian rong fu wu xin ling yu rong xiang gong si cheng li shi zhou nian zuo dian ci jian rong shi yan shi kai ye dian li
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page:109
Analysis of Uncertainty of Measurement in Salt Spray Test
lu yong li ; sun cheng jun
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page:87-90
Design of Generator Satisfying Voltage Variation and LVRT
li zhi gang ; jia li dong ; huang xue jun
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page:103-106
Antennas Layout Based on Multi-objective Optimization Algorithm
zhu qi long ; chen shao chang ; cai yun long
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page:79-81
Introduction of the Latest Version of KDB 616217 D04
yu zong zuo ; lin jun ; lin xiao jun ; qi dian yuan
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page:50-52
Automotive Remote Key System Simulation
ma qian ; xiao jing ; wang hong wu
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page:74-77
EMC Case Analysis of the PC System
lv fei yan ; cao xin ; wang liang
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page:62-64
Introduction of the Latest Version of KDB 447498 V05
lin jun ; yu zong zuo ; lin xiao jun ; qi dian yuan
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page:46-49
Progress in Preparation of Nickel-zinc Ferrite System
liu fu ming ; qiu jian cong ; wang yue hua ; guo mei cheng ; xie yu
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page:70-73
Rectification on Electromagnetic Radiation Interference of Electric Vehicle
gao xin jie ; bai jian ; zhang hong chao
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page:58-60,106
Study on the Preparation and Performance of Microwave-absorbing Ceilings for Electromagnetic Protection
li jun hao ; zhuang ; he xiao chuan ; duan yu ping
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page:66-68,81
Research on Field Uniformity Calibration Method of GTEM Cell
chen zhi feng ; deng ying ning ; deng dai ji
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page:42-44,77
Introduction of the Latest Version of KDB 865664
xu shi jun ; zuo xiao gang ; lin xiao jun ; zhao jing ; qi dian yuan
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page:53-56
Insulated Winding Wire Test for IT/AV Device
wang xiao dong
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page:33-35
Main Technical Discussions in 2013 Plenary Meeting of IEC/TC 108
wang ying ; he peng lin
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page:26-27
Analysis on State of the Art of OATS
xie ming ; cui xiao hai ; meng dong lin ; huang pan ; li xue jin
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page:15-21
Analysis on Key Factors Affecting the Voltage Disturbance Measurement
zeng bo ; deng jun yong
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page:37-41
Analysis on GB/T 5169.5-2008
le jun ; chen ying xia
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page:29-31
Discussion on Secondary Lithium Battery Safety Standards in IEC SC21A 2013 Meeting
he peng lin
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page:23-24
Introduction to the Individualized US EMC Laboratory Accreditation for Automotive Electronics
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page:9-11
xin xi dong tai
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page:12-14