Semiconductor Technology 1999 Issue 5 Development of Preparation and Property Analysis of SiGeC Alloys

Journals A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

Semiconductor Technology
1003-353X
1999 Issue 5

Development of Preparation and Property Analysis of SiGeC Alloys
Qi Zhen;Lu Huanming;Huang Jingyun;Zhao Binghui;Ye Zhizhen

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Light Amplified Characteristic of the Darlington Silicon Photo-transistor
Zheng Yunguang;Zhang Peining;Guo Weilian;Li Shurong;Wang Haiying

..............page:9-11

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au-sn he jin dian du
wang li li

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simox cai liao zhu f+ hou de sims fen xi
zeng jian ; gao jian xia

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..............page:30-33

Analysis of Noise Properties on GaAs/AlGaAs Quantum Well Infrared Photodetectors
Sheng Huaimao;Wang Jiakuan;Gao Qian;Xia Guanqun;Zhao Jianlong

..............page:26-29

Characterization of Silicon Surface Hydrophilicity Treatment
He Jin;Chen Xingbi;Yang Chuanren;Wang Xin

..............page:23-25

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Study of the Cleanness Optimized Technology on LED-GaP Epitaxial Wafers
Wang Shuifeng;Hu Limin;Zeng Yuxin;Zeng Qingcheng

..............page:12-15