1003-353X
2003 Issue 9
Two-phase clocking
zheng zhao qing ; ao yu hong ; chen chao yang ; shen xu bang
zheng zhao qing ; ao yu hong ; chen chao yang ; shen xu bang
..............page:65-68
..............page:92
..............page:89-91
..............page:85-88
Application of pseudorandom testing in mixed-signal circuits parameter test
ye ming jun ; yan xue long ; lei jia ; guo xue ren
ye ming jun ; yan xue long ; lei jia ; guo xue ren
..............page:25-28
The strategy of testing the integrity of boundary scan test infrastructure
wang ning ; li gui xiang ; yang jiang ping
wang ning ; li gui xiang ; yang jiang ping
..............page:22-24,43
The development and application actuality of DSP technology
wei xiao yun ; chen jie ; zeng yun
wei xiao yun ; chen jie ; zeng yun
..............page:18-21
..............page:13-17
..............page:7-12,21
"shi wu " ji hua guo ban shi zhong guo ic xin pian zhi zao gong yi xian jian she xian zhuang
zhu zuo zuo
zhu zuo zuo
..............page:4-6
..............page:2-3
..............page:1
..............page:83-84
..............page:81-82
quiccsupply xi lie : mo tuo luo la powerquicc wei chu li qi de dian yuan guan li jie jue fang an -- duo lu shu chu dian yuan
mo tuo luo la ban dao ti
mo tuo luo la ban dao ti
..............page:79-80
sc26c94 zai ce kong xi tong zhong de ying yong
zhang xiao lin
zhang xiao lin
..............page:75-78
..............page:72-74
Programmable logic implementation of GPS/GLONASS synchronization in CDMA2000 base station
liu chun ping ; an he nan ; xiong shui jin
liu chun ping ; an he nan ; xiong shui jin
..............page:69-71
Influence of gradient-doping on conversion efficiency of solar cells
wang ai kun ; zhou guo xiang ; yang ren ; li guo chang
wang ai kun ; zhou guo xiang ; yang ren ; li guo chang
..............page:63-64,78
Research and treatment of the parent population samples failed in DPA
zhao he yi ; zheng peng zhou
zhao he yi ; zheng peng zhou
..............page:60-62
agilent 93000 soc xi lie cai yong de ye leng ji shu dui ce shi ji ce shi cheng ben de hao chu
an jie lun ke ji
an jie lun ke ji
..............page:57-59
xin pian ji qian ru shi wen du wen ding zhuang zhi que bao gao jing du he di cheng ben ce shi
ding hui wen
ding hui wen
..............page:55-56,59
chao yue bga feng zhuang ji shu
yang jian sheng
yang jian sheng
..............page:52-54
Content and methods of shop-floor control in semiconductor wafer fabrication
shao zhi fang ; qian sheng san
shao zhi fang ; qian sheng san
..............page:48-51
..............page:44-47
New progress in SOI technology
lin cheng lu
lin cheng lu
..............page:39-43
Application and evolution of back grinding technology for large size wafer
kang ren ke ; guo dong ming ; huo feng wei ; jin zuo ji
kang ren ke ; guo dong ming ; huo feng wei ; jin zuo ji
..............page:33-38,51
A built-in self-test technology of digital VLSI circuits
gao ping ; cheng li ; wang zhen yu ; zhu jun ; shi yi qiao
gao ping ; cheng li ; wang zhen yu ; zhu jun ; shi yi qiao
..............page:29-32