1003-353X
2008 Issue 10
..............page:936
..............page:935-936
fei si ka er xi lie chong dian qi ic ke ding zhi xing yu gao jing du ye nei ling xian
fei si ka er ban dao ti ( zhong guo ) you xian gong si
fei si ka er ban dao ti ( zhong guo ) you xian gong si
..............page:933-934
Oscillation-Based Test Technique for Analog Circuits
Hu Geng;Wang Hong;Yang Shiyuan
Hu Geng;Wang Hong;Yang Shiyuan
..............page:845-849
Study on Ka Band Dielectric Resonator
Wang Jia;Lin Yong;He Qingguo
Wang Jia;Lin Yong;He Qingguo
..............page:930-932
Impedance Matching Technique Using Power Load Pull
Luo Xi;Liu Yongqiang;Cai Shujun
Luo Xi;Liu Yongqiang;Cai Shujun
..............page:927-929
Design of C Band GaAs MMIC Low Noise Amplifier
Wang Dehong;Liu Zhijun;Liu Wenjie;Gao Xuebang;Wu Hongjiang
Wang Dehong;Liu Zhijun;Liu Wenjie;Gao Xuebang;Wu Hongjiang
..............page:923-926
Research on Stability in 125 kHz RFID Feedback System
Yang Biao;Tian Quping;Ying Jianhua
Yang Biao;Tian Quping;Ying Jianhua
..............page:917-922
Liquid Crystal on Silicon Display Driver Based on CPLD
Huang Ran;Wang Wenbo;Wang Xiaohui;Du Huan;Han Zhengsheng
Huang Ran;Wang Wenbo;Wang Xiaohui;Du Huan;Han Zhengsheng
..............page:913-916
Design of Ethernet over E1 Bridge System Based on Embedded Technology
Liu Huazhu;He Qianhua
Liu Huazhu;He Qianhua
..............page:909-912
Analysis on Epitaxy Wafer Thickness Error Measuring in Spreading Resistance Profile
Zhang Zhiqin;Li Shenghua;Zhang xiuli
Zhang Zhiqin;Li Shenghua;Zhang xiuli
..............page:905-908
..............page:902-904
Electrocmagnetic Pulse Damage on GaAs LNA and Its Analysis
Li Yongbing;Wang Hailong
Li Yongbing;Wang Hailong
..............page:899-901
Research on Illumination Property of Semiconductor Quantum Dot
Guan Zhong;Zhang Daoli
Guan Zhong;Zhang Daoli
..............page:895-898
Theoretical Estimation on the Parameters of Dopant Center in Long After- Glow Luminescence Materials
Li Xinzheng;Zheng Bin
Li Xinzheng;Zheng Bin
..............page:892-894
Reduced Light Reflection of Textured Multi-Crystalline Silicon Via Wet Etchant Using Ultrasound
Wang Yifan;Zhou Lang
Wang Yifan;Zhou Lang
..............page:888-891
Preparation of Ce0.8Gd0.2O1.9-δSolid Electrolyte of Oxide Ion
Chen Ailian;Chen Yang;Yang Jianping
Chen Ailian;Chen Yang;Yang Jianping
..............page:885-887
Study on Low-Temperature Deposition of GaN Films on Glass Substrate
Wang Wenyan;Qin Fuwen;Wu Aimin;Song Shiwei;Li Rui;Jiang Xin;Xu Yin;Gu Biao
Wang Wenyan;Qin Fuwen;Wu Aimin;Song Shiwei;Li Rui;Jiang Xin;Xu Yin;Gu Biao
..............page:880-884
Study on the SSD Distribution of Large Size Si Wafer Rotational Ground Surface
Gao Wei;Zhang Yinxia;Kang Renke
Gao Wei;Zhang Yinxia;Kang Renke
..............page:876-879,926
Influence of Process on Interracial Capacitance of PZT Thin Films
Fei Jinwen;Tang Ting'ao
Fei Jinwen;Tang Ting'ao
..............page:872-875
Solution for Mask Haze Defect
Chen Yao;Huang Qiyu
Chen Yao;Huang Qiyu
..............page:869-871
90 nm Contact Layer Cooper Diffuse Defect Analysis and Solving Methods
Yan Haibin;Cheng Xiulan
Yan Haibin;Cheng Xiulan
..............page:866-868
Technique Research on Etching Rate of Silicon
Cai Changlong;Ma Rui;Zhou Shun;Liu Huan;Liu Weiguo
Cai Changlong;Ma Rui;Zhou Shun;Liu Huan;Liu Weiguo
..............page:862-865
Stability of Sehottky Contact in Ti/Pt/Au of SiC MESFET
Cui Xiaoying;Huang Yun;En Yunfei;Chen Gang;Bai Song
Cui Xiaoying;Huang Yun;En Yunfei;Chen Gang;Bai Song
..............page:859-861,916
Influence of Junction Depth on Photo Responsivity of Detector
Zhuang Sixiang;Feng Shiwei;Wang Chengdong;Bai Yunxia;Su Rong;Meng Haijie
Zhuang Sixiang;Feng Shiwei;Wang Chengdong;Bai Yunxia;Su Rong;Meng Haijie
..............page:855-858
Study on the X-Band F-Gate Field-Plate for AlGaN/GaN HEMTs
Wang Dongdong;Liu Guoguo;Liu Dan;Li Chengzhan;Liu Xinyu
Wang Dongdong;Liu Guoguo;Liu Dan;Li Chengzhan;Liu Xinyu
..............page:850-854,922