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Semiconductor Technology
1003-353X
2008 Issue 9
zong he xin wen
..............page:844
ban dao ti ji shu gao yue
..............page:插1
chan ye xin wen
..............page:842-844
fei si ka er dong li zong cheng wei kong zhi qi ti gong pai fang kong zhi kang ji quan qiu bian nuan
fei si ka er ban dao ti ( zhong guo ) you xian gong si
..............page:840-841
Research of Monolithic Circuit for Measuring Frequency
Ren Huailong;Chen Xing;Mo Lidong;Liao Bin;Wu Hongjiang
..............page:836-839
Temperature Controller Based on PIC Microcontroller
Liu Baifen;Lü Tao
..............page:833-835
Power and Area Efficient FFT Processor for WiMax OFDM Mode
Xiong Daoqi;Hei Yong;Zhou Yumei
..............page:829-832
Optimized Design of Low Power RFID Transponder Power Supply Circuit
Hu Jianguo;Tan Hongzhou;Wei Zhaoqin;Zhang Zhongzhi
..............page:825-828,839
Low-Power IF Complex Filter with on-Chip Tuning Circuit Based on PLL
Yun Lei;Li Guolin
..............page:821-824
Design of an UHF RFID Interrogator Based on ISO/IEC 18000-6C
Lin Xi;Wang Jingchao;Zhang Chun
..............page:817-820
Research of the Comparison Method in Phase Noise Measurement System
Liu Hongchun;Liu Hongyun
..............page:814-816,820
Auto-Tuning Temperature Control System for High Temperature Oxidation Diffusion Furnace
Yang Yibo;Yin Wensheng;Wang Chunhong;Zhu Yu
..............page:810-813
Analyze on Thermal Failure Of Microwave Power Transistor
Liu Hongbing;Xu Yang
..............page:807-809
Experiment on Electrostatic Damage to Microelectronic Device
Yang Shiliang;Zhang Xinhui;Ji Guoqing;Tang Weihong;Li Hanjun
..............page:801-802,809
Research of Field-Induced Optical-Rectification Effect of Si Material
Han Huanpeng;Zhang Xiaoting;Liu Feng
..............page:798-800
Power MOSFET Ultra Thin Wafer Grinding Process Development
Peng Shuangqing
..............page:796-797,813
Ascertain on the Reference Plane of <511> Orientation GaAs
Tong Liying;Yang Chunming;Wang Chunmei;Shi Jixiang;Wang Cong
..............page:793-795
Si Damage Defect Analysis and Solving Methods
Chen Wujia;Zhu Chenliang;Cheng Xiulan
..............page:791-792
Recent Development of High-Efficiency High-Brightness Semiconductor Lasers
Li Chen;Liu Yingbin;Song Xueyun
..............page:748-751,755
Recent Progress on the Materials and Structures for Phase-Change Random Access Memory
Liu Bo;Song Zhitang;Feng Songlin
..............page:737-742
Research Progress of Materials for 193 nm Immersion Lithography
He Jian;Gao Ziqi;LiBing;Zheng Jinhong;Mu Qidao
..............page:743-747
Research of Delamination Phenomenon Under Nanoindentation on Cu/Ta/SiO2/Si Thin Film
Wu Zijing;Wu Xiaojing;Lu Qian;Shen Weidian;Jiang Bin
..............page:787-790
Study and Improvement on Etching Method of Double Gate Oxide in LDMOS Process
Wang Wenbo;Song Limei;Wang Xiaohui;Du Huan;Han Zhengsheng
..............page:784-786
Design and Implementation of a Microwave Bipolar Transistor
Mi Baoliang;Wu Guozeng
..............page:780-783
Study on Optical Properties of Microlens Array for LED
Tian Dalei;Guan Rongfeng;Wang Xing;Zhao Wenqing
..............page:776-779
Study of 500 V Depletion-Mode NLDMOS
Li Weicong;Li Haisong;Sun Weifeng
..............page:772-775
C-V Test Analysis of Dark Current About InP Heterojunction Interface
Lin Lin;Liu Yingbin;Chen Hongtai;Wang Jing;Cui Qi
..............page:769-771,779
GaAs Vertical Structure PIN Diode Limiter
Wang Jinghui;Wei Hongtao;Zhang Lijiang
..............page:766-768
Inhomogeneously Multi-Longitudinal-Mode Lasing Quantum-Dot Lasers Grown by GSMBE
He Kun;Gong Qian;Li Shiguo;Li Jian
..............page:762-765
CMOS Process Compatible Thermopile Infrared Detector
Yang Hengzhao;Xiong Bin;Li Tie;Wang Yuelin
..............page:759-761,765
Processing Technique of High Purity Hydrogen System
Shi Jie
..............page:756-758