1003-353X
2010 Issue 12
Reliability Analysis of the SiP Module Based on COB Technology
Li Zhibo;Chen Supeng;Li Guoyuan
Li Zhibo;Chen Supeng;Li Guoyuan
..............page:1194-1198,1231
..............page:1157,1208,1232-1235
Research on the Fabrication of MEMS Ultrasonic Separators Based on SOI Materials
Xiao Hanli;Ding Jiexiong;Hua Chenhui;Chen Dong;Wang Yuxiang
Xiao Hanli;Ding Jiexiong;Hua Chenhui;Chen Dong;Wang Yuxiang
..............page:1145-1148,1173
Study on Chromium-Free Etching for Detection of Oxidation Induced Stacking Faults in Heavily Doped CZ Silicon Ingot
Cao Zi;Shi Yu;Li Hui;Sun Yan;Bian Yongzhi;Zhai Fuyi
Cao Zi;Shi Yu;Li Hui;Sun Yan;Bian Yongzhi;Zhai Fuyi
..............page:1178-1182
Reliability Research of Solder Ball Placement Bumping Process
Xiao Qiming;Wang Hui
Xiao Qiming;Wang Hui
..............page:1190-1193,1212
Gm-C Filter with an Accurate Constant-Gm Bias Circuit
Liu Yonggang;Guo Guiliang;Du Zhankun;Yan Yuepeng
Liu Yonggang;Guo Guiliang;Du Zhankun;Yan Yuepeng
..............page:1217-1221
Design Model of Hyperabrupt Varactor Diodes
Qian Gang;Hao Dabing;Gu Qing
Qian Gang;Hao Dabing;Gu Qing
..............page:1158-1161
Morphology and Morphology Evolution Model of ZnO/ZnS Core/Shell Nanostructures
Duan Wenjing;Guo Qihua;Yang Hongchao;Zheng Dong;Wu Zhenglong;Wang Yinshu
Duan Wenjing;Guo Qihua;Yang Hongchao;Zheng Dong;Wu Zhenglong;Wang Yinshu
..............page:1162-1166
Study on the Stability of Removal Rate of CMP for Silicon Wafer in ULSI
Zhao Qiaoyun;Zhou Jianwei;Liu Yuling;Liu Xiaoyan;Liu Haixiao
Zhao Qiaoyun;Zhou Jianwei;Liu Yuling;Liu Xiaoyan;Liu Haixiao
..............page:1167-1169,1182
Impact Analysis of Hot Zone Structure on Power Consumption During CZ Silicon Growth
Deng Shujun;Gao Yu;Jiang Jian;Dai Xiaolin;Wu Zhiqiang;Liu Bing
Deng Shujun;Gao Yu;Jiang Jian;Dai Xiaolin;Wu Zhiqiang;Liu Bing
..............page:1183-1185
Study on Micro PCR System and Its Temperature Control Property
Guo Shilei;Liu Zewen;Qin Jian;Tian Hao;Si Weihua
Guo Shilei;Liu Zewen;Qin Jian;Tian Hao;Si Weihua
..............page:1204-1208
High Linearity Low Power Consumption 4-Order S-C Filter
Du Dahai;Xiong Fei;Lin Yunsong
Du Dahai;Xiong Fei;Lin Yunsong
..............page:1222-1225
Low Voltage Phase-Locked Loop with Stabilized Bandwidth
Yang Dong;Li Dongmei
Yang Dong;Li Dongmei
..............page:1209-1212
Flexible and Transparent Conducting CdO Films Deposited by RF Magnetron Sputtering
Ji Zhenguo;Wu Qiuhong;Mao Qinan
Ji Zhenguo;Wu Qiuhong;Mao Qinan
..............page:1170-1173
Effects of the Thickness of NPB on the Performances of Stacked White Organic Light-Emitting Devices
Liu Dinghan;Zhang Fanghui;Yan Honggang;Jiang Qian
Liu Dinghan;Zhang Fanghui;Yan Honggang;Jiang Qian
..............page:1153-1157
..............page:1199-1203
Study on Human Resource Demand and Education Model of the Microelectronics Industry
Ding Wei;Chen Feiyu
Ding Wei;Chen Feiyu
..............page:1226-1231
Fabrication and Investigation on Electrical Properties of Ge MOS Devices with HfO2/TaON Gate Stack
Zhang Xuefeng;Ji Hongbing;Qiu Yunzhen;Wang Zhiliang;Xu Jingping
Zhang Xuefeng;Ji Hongbing;Qiu Yunzhen;Wang Zhiliang;Xu Jingping
..............page:1149-1152
Design of Serial Low Voltage Different Signal Receiver
Wei Xueming;Li Ping
Wei Xueming;Li Ping
..............page:1213-1216
Radial Variation of Minority Carrier Lifetime in FZ-Si with Higher Resistivity
Yan Ping;Zhang Dianchao;Suo Kainan;Pang Bingyuan
Yan Ping;Zhang Dianchao;Suo Kainan;Pang Bingyuan
..............page:1186-1189,1221
Experimental Study of Al-Mg Alloy Chemical Mechanical Polishing in Alkaline Condition
Xu Wenzhong;Liu Yuling;Niu Xinhuan;Mu Huilai
Xu Wenzhong;Liu Yuling;Niu Xinhuan;Mu Huilai
..............page:1174-1177