1003-353X
2014 Issue 4
Research Progress on Si Based Ⅱ-Ⅵ Single-Junction and Multi-Junction Solar Cells
Zhang Linen;Liu Chao;Cui Lijie;Zeng Yiping;Key Laboratory of Semiconductor Materials Science;Institute of Semiconductors;Chinese Academy of Science;
Zhang Linen;Liu Chao;Cui Lijie;Zeng Yiping;Key Laboratory of Semiconductor Materials Science;Institute of Semiconductors;Chinese Academy of Science;
..............page:241-247
..............page:247
An Improved CMOS Charge Pump PLL Circuit
Li Yanming;Tong Qian;Ni Xuwen;Qiu Yanzhang;Wen Changbao;Wu Kaikai;Chai Hong;Institute of Micro-Nanoelectronics;School of Electronics and Control Engineering;Chang’an University;
Li Yanming;Tong Qian;Ni Xuwen;Qiu Yanzhang;Wen Changbao;Wu Kaikai;Chai Hong;Institute of Micro-Nanoelectronics;School of Electronics and Control Engineering;Chang’an University;
..............page:248-253
..............page:253
Design of Several ESD Protection Structures Applied to the Key Touch Pad Detector IC
Ju Shuirong;Lu Jian’en;Zhang Hailei;Department of Electronic Information Engineering;Jiangsu College of Information Technology;
Ju Shuirong;Lu Jian’en;Zhang Hailei;Department of Electronic Information Engineering;Jiangsu College of Information Technology;
..............page:254-258+278
Broadband Low Noise Amplifier MMIC
Dai Jian;Yao Zhihong;Zhao Ruihua;Song Xuefeng;Liu Shuai;The 13th Research Institute;CETC;
Dai Jian;Yao Zhihong;Zhao Ruihua;Song Xuefeng;Liu Shuai;The 13th Research Institute;CETC;
..............page:259-263
Variable Gain Power Amplifier MMIC
Diao Rui;Zhao Ruihua;The 13th Research Institute;CETC;
Diao Rui;Zhao Ruihua;The 13th Research Institute;CETC;
..............page:264-267
Design of Low Noise and Low Power Microcapacitance Readout ASIC
Ren Chen;Yang Yongjun;The 13th Research Institute;CETC;
Ren Chen;Yang Yongjun;The 13th Research Institute;CETC;
..............page:268-273+284
Optimization Design of 700V VDMOS Termination Structure
Gan Honglin;Feng Quanyuan;Wang Dan;Wu Kepang;Institute of Microelectronics;Southwest Jiao Tong University;
Gan Honglin;Feng Quanyuan;Wang Dan;Wu Kepang;Institute of Microelectronics;Southwest Jiao Tong University;
..............page:274-278
Geiger Mode Simulation of the Single Photon Avalanche Diode Based on CMOS Technology
Wang Cheng;Meng Liya;Wang Qingxiang;Yan Xuliang;Key Laboratory of Optoelectronic Technology and Systems of the Education Ministry of China;Chongqing University;
Wang Cheng;Meng Liya;Wang Qingxiang;Yan Xuliang;Key Laboratory of Optoelectronic Technology and Systems of the Education Ministry of China;Chongqing University;
..............page:279-284
10 Gbit/s 850 nm pin Photoelectric Diode
Wu Zhiwei;Tang Bao;Wang Renfan;Accelink Technologies Co.;Ltd.;
Wu Zhiwei;Tang Bao;Wang Renfan;Accelink Technologies Co.;Ltd.;
..............page:285-288
Study on the Growth of the GaAs/AlGaAs Core-Shell Nanowires
Zhao Cuijian;Sun Sujing;Li Xiaoqing;School of Physics and Electrical Information Engineering;Shijiazhuang University;School of Information Science and Technology;Shijiazhuang Tiedao University;Unit 69223 of PLA;
Zhao Cuijian;Sun Sujing;Li Xiaoqing;School of Physics and Electrical Information Engineering;Shijiazhuang University;School of Information Science and Technology;Shijiazhuang Tiedao University;Unit 69223 of PLA;
..............page:289-293
..............page:293
Research Progress on the Preparation Methods of Diluted Magnetic Semiconductors
Hou Zhiqing;Liu Dongzhou;Na Mula;Science College;Agricultural University of Hebei;
Hou Zhiqing;Liu Dongzhou;Na Mula;Science College;Agricultural University of Hebei;
..............page:294-299
Soldering Reliability of the SMO-8 Package Device
Wei Aixin;Liu Xiaohong;Wang Zhihui;The 13th Research Institute;CETC;
Wei Aixin;Liu Xiaohong;Wang Zhihui;The 13th Research Institute;CETC;
..............page:300-304+314
Effective Evaluation Method for PEM Applying to the Filed of High Reliability
Li Wei;Song Yuxi;Tong Liang;National Semiconductor Device Quality Supervise and Inspection Center;
Li Wei;Song Yuxi;Tong Liang;National Semiconductor Device Quality Supervise and Inspection Center;
..............page:305-308+314
SRN Batch Process Model of Cluster Tools in Semiconductor Manufacturing
Zheng Xiuhong;School of Computer Science and Technology;Shenyang University of Chemical Technology;
Zheng Xiuhong;School of Computer Science and Technology;Shenyang University of Chemical Technology;
..............page:309-314
..............page:315
..............page:316-317
..............page:318-319