Research Progress of Micro-Thermoelectric Generators
Wu Liqing;Xu Dehui;Xiong Bin;State Key Laboratory of Microsystem Technology;Shanghai Institute of Microsystem and Information Technology;Chinese Academy of Sciences;

..............page:721-729

Preparation Process of Perovskite Absorption Layer for Perovskite Solar Cells
Wu Yamei;Yang Ruixia;Tian Hanmin;Wang Ru;Hua Zhongqiu;Chen Shuai;Tianjin Key Laboratory of Electronic Materials and devices;School of Electronics and Information Engineering;Hebei University of Technology;

..............page:730-738+782

Design of a Fast Response LDO with the Dynamic Compensation Circuit
Zhou Chaoyang;Feng Quanyuan;Institute of Microelectronics;Southwest Jiaotong University;

..............page:739-743

Technique of the Circuit-Layout Design Automation Optimization for the Standard Cell
Fang Shan;Wu Yuping;Chen Lan;Zhang Xuelian;Zhang Qi;Institute of Microelectronics;Chinese Academy of Sciences;

..............page:744-748+782

Design of Balanced S-Band Limiter MMIC Low Noise Amplifier
Kong Lingjia;Yao Zhihong;Gao Changzheng;Chen Shubin;13th Research Institute of China Electronics Technology Group Corporation;

..............page:749-753

High-Precision Standard Cell Variation Measurement Circuit for Layout Proximity Effect
Hu Xinyi;Lin Yinyin;State Key Laboratory of ASIC and System;Fudan University;

..............page:754-758

A Method of Improving the Endurance for Triple Split Gate Flash Memory
Cao Zigui;Dai Minjie;Gao Chao;Huang Hao;Wang Hui;Cheng Kai;Shanghai Huahong Grace Semiconductor Manufacturing Corporation;

..............page:759-763+774

Research Status and Prospects of the Silicon-Based Current Regulative Diode
Zhao Shengzhe;Ma Wanli;Zhao Wenkui;Founder Microelectronics International Co.;Ltd.;

..............page:764-769

Effect of the Oxidant in Alkaline Copper Fast Polishing Slurry on the Chemical Mechanical Planarization
Wang Yuexia;Liu Yuling;Wang Chenwei;Yan Chenqi;Institute of Microelectronics;Hebei University of Technology;

..............page:770-774

Emitter Design and Reliability Study of Back Contact Solar Cells
Zhou Tao;Lu Xiaodong;Wu Yuanqing;Xia Tingting;School of New Energy;Bohai University;

..............page:775-782

Research on the Field Storage Reliability of Transistors in the Marine Environment
Yuan Fang;Xie Xuesong;Zhang Xiaoling;Wang Gaili;Chen Jun;Ha Yue;Li Jianan;School of Electronic Information and Control Engineering;Beijing University of Technology;Chinese Navy 701 Factory;

..............page:783-788

Main Contents of 2016

..............page:788

Influence of Diameters of WLCSP Solder Balls on the Shear Strength and Failure Modes
Li Xiao;Wang Jun;Department of Material Science;Fudan University;

..............page:789-792

A Judgment Method for Electromigration Testing Failure Time
Qian Yanni;Yin Binfeng;Zhou Ke;Yu Hewei;Shanghai Huali Microelectronics Corporation;

..............page:793-797

The IEEE 11^th International Conference on ASIC

..............page:798-799

2015 quan guo xin xing ban dao ti gong lv qi jian ji ying yong ji shu yan tao hui hui yi tong zhi

..............page:800