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Semiconductor Technology
1003-353X
2016 Issue 2
New Progress in GaN High Frequency Switch Power Electronics( Continued)
Zhao Zhengping;China Electronics Technology Group Corporation;Science and Technology on ASIC Laboratory;The 13th Research Institute;CETC;
..............page:81-88
Research Developments in Silicon Carbide Gate Turn-off Thyristors
Zhou Caineng;Yue Ruifeng;Wang Yan;Institute of Microelectronics;Tsinghua University;
..............page:89-95
Design of a 10 GHz Low-Power Multi-Modulus Frequency Divider Using E-TSPC Technique
Hu Shuaishuai;Zhou Yumei;Zhang Feng;Institute of Microelectronics;Chinese Academy of Sciences;
..............page:96-101
Design of 0.13 μm CMOS Stacked-FET Two-Stage Power Amplifier
Wang Kun;Cheng Xinhong;Wang Linjun;Xu Dawei;Zhang Zhuan;Li Xinchang;School of Material Science and Engineering;Shanghai University;Engineering Center of Automotive Electronics;Shanghai Institute of Micro-System and Information Technology;Chinese Academy of Sciences;
..............page:102-106
Design and Simulation of Charge Coupled Internal Transparent Collector-IGBT
Li Zhe;Hu Dongqing;Jin Rui;Jia Yunpeng;Tan Jian;Zhou Xuan;Zhao Bao;College of Electronic Information and Control Engineering;Beijing University of Technology;Dept of Electrical Ergineering New Material and Microelectronics institute;State Grid Smart Electrical Engineering;
..............page:107-113+158
N-Polar GaN/AlGaN Heterostructures and Field Effect Transistors
Fang Yulong;Wang Xianbin;Lü Yuanjie;Wang Yingmin;Gu Guodong;Song Xubo;Yin Jiayun;Feng Zhihong;Cai Shujun;Zhao Zhengping;Science and Technology on ASIC Laboratory;The 13th Research Institute;CETC;The Second Research Institute;CETC;
..............page:114-118
Research on the Photoelectric Characteristics of Uniform Grating DFB-LD
Zhao Run;Zhang Xiaoguang;Cao Chentao;Che Xianghui;The 13th Research Institute;CETC;
..............page:119-123
Effect of Sputtering Power on Structural and Electrical Properties of the HfO2 Thin Film
Mu Jiliang;He Jian;Zhang Peng;Ma Zongmin;Chou Xiujian;Xiong Jijun;School of Instrument and Electronics;North University of China;Science and Technology on Electronic Test and Measurement Laboratory;North University of China;
..............page:124-128
Highly Efficient Cleaning Fliud for Germanium Crystalline Polished Wafers
Yang Hongxing;Chen Chen;Wang Yunbiao;He Yuandong;Geng Li;The 46thResearch Institute;CETC;
..............page:129-132
Growth of Ge Epilayers on Si Substrates
Zhou Zhiwen;Shen Xiaoxia;Li Shiguo;School of Electronic Communication Technology;Shenzhen Institute of Information Technology;
..............page:133-137
Research of Inhibition p Type Germanium Crystal Dislocation by Vertical Gradient Freeze Technique
Zhou Chunfeng;Lan Tianping;Zhou Chuanxin;The 46thresearch institute;CETC;
..............page:138-142
Analysis of the Hydrogen Effect Mechanism in GaAs PHEMT Low Noise Amplifier
Lin Liyan;Li Yongbing;The 13th Research Institute;CETC;
..............page:143-147
Application of SAM in Flip Chip Components
Jia Meisi;Zhang Sujuan;Chen Zhengping;School of Reliability and Systems Engineering;Beijing University of Aeronautics and Astronautics;
..............page:148-152
Built-in Testing Circuit for Antifuse-Based FPGA
Ma Jinlong;Lu Libing;The 58thResearch Institute;CETC;
..............page:153-158