..............page:1-4,11
..............page:41-45,61
X-Ray Total Dose Effect for CMOS Devices
yao yujuan; gong jiancheng; he baoping; peng honglun; yang haifan; zhou hui; zhang zhengxuan; guo hongxia (northwest institute of nuclear technology; xi an 710024)
..............page:58-61
Program PLD to a Digital ASIC
wang yanfang ; wang xiaoping ; wang yanyong ; ma yuehui ( department of electonic engineering shijiazhuang railway institute; shijiazhuang 050043) ( hebei baoshi group; shijiazhuang 050000)
..............page:48-51
..............page:17-22,40