shi jia ke ji fa zhan you xian gong si

..............page:48

Study of the display technique of microlens array
dong xiao-chun; du chun-lei (state key lab of optical technologies for microfabrication; institute of optics&electronics; chinese academy of sciencs; chengdu610209; china)

..............page:29-32,45

The investigation of noise in nanoelectronic devices and its applica tion
zhang zhi-yong; wang tai-hong (institute of physics; chinese academy of science; beijing100080; china)

..............page:6-15

na mi qi jian zhi zuo de san zhong fang shi

..............page:5

Consideration of GaN IC development
yuan ming-wen (the13th research institute; cetc; shijiazhuang050051; china)

..............page:1-5

na mi ji shu yu chan ye hua

..............page:46-47

Growth of InGaAs /In _(0.32≤x≤0.52)Al_(1-x)As MM-HEMTs materials by MBE
qiu kai; zhang xiao-juan; chen jian-lu (nanjing electronic devices institute; nanjing210016; china)

..............page:26-28

Research advances of gas nanosensors
ren hong-liang 1 ; he jin-tian 1 ; liang er-jun 1 ; tian zhen-feng 2(1.school of physics&engineering; zhengzhou university; zhengzhou450052; china; 2.department of technical physics; zhengzhou institute of light industry; zhengzhou450002; china)

..............page:16-21

90nm ji shu jin cheng

..............page:46

Characteristic and preparation of nano gas sensitive materials by spraying coprecipitation
liu jin-huai 1; 2 ; jiao zheng 1 ; zhang jian 2 ; yu zeng-liang 2(1.hefei institute of intelligent machines; chinese academy of sciences; hefei230031; china; 2.institute of plasma physics; chinese academy of sciencec; hefei230031; china)

..............page:22-25,42

Technology and application of STM·IPC-205B
liu gui-fen 1 ; zhong hong-jie 1 ; yang xue-heng 2(1.college of science; tianjin university of technology; tianjin300160; china; 2.college of mathematics and physics; chongqing university; chongqing400044; china)

..............page:39-42

na dian zi xi tong wei xi tong

..............page:38

Measurement on the strain of elastic diaphragm of silicon dual-E structure by laser beam imaging
deng yong-he (dept.of mathematics and physics hunan institute of engineering; xiangtan411100; china)

..............page:43-45

Measurement on the strain of elastic diaphragm of silicon dual-E structure by laser beam imaging
deng yong-he (dept.of mathematics and physics hunan institute of engineering; xiangtan411100; china)

..............page:33-38