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1001-5507
2005 Issue 1
Strained Si:New Technology for Upgrading the Performance of Deep Micron Si CMOS Devices
chen chang-chun1; yu ben-hai1; liu jiang-feng1; liu zhi-hong2; qian pei-xin2(1.college of physics and electronics engineering; xinyang normal university; xinyang 464000; china; 2.institute of microelectronics of tsinghua university; beijing 100084; china)
..............page:13-18
A New Method of Preparing Cd-Sb-W and Cd-Sn-W Series Sensitive Ceramic
wang meng-kui1; yang yu-qiang1; liu wen-lei2; liu lian-li1(1.department of physics; bohai university; jinzhou 121003; china; 2.dandong guotong electronic component limited company; dandong 118002; china)
..............page:22-24,36
Research of Wet-Etching Groove on PYREX Glass
lin yan-fei1a; zheng zhi-xia1a; 2; zhang dan1a; feng yong-jian1b(1a.department of mechanical and electronic engineering; 1b.pen tung sah mems research center; xiamen university; xiamen 361005; china; 2.department of mechanical and electronic engineering; putian university; putian 351100; china)
..............page:33-36
New Conception of Transistors
yuan ming-wen(national key laboratory of asic; the 13th research institute; cetc; shijiazhuang 050051; china)
..............page:1-6
Research Advances of PEBBLE Nanosensors
tian zhen-feng1; 2; guo mao-tian1; chen xing-ke1; wang hui3; wang shi-ming1; zhang rong-lan1(1.school of physics & engineering; zhengzhou university; zhengzhou 450052; china; 2.department of technical physics; zhengzhou institute of light industy; zhengzhou 450002; china; 3.institute of science; zhanjiang ocean university; zhanjiang 524025; china)
..............page:7-12,47
The Publicity State and Analysis of Patents for Nano Science and Technology in Japan
wang bu-ran; yang bang-chao(institute of micro electronics and solid electronics; uestc; chengdu 610054; china)
..............page:19-21
Fabrication and Performance of Double Layer Suspended Spiral Inductor
zhao xiao-lin; wang xi-ning; zhou yong; cai bing-chu(institute of micro/nanometer science and technology; shanghai jiaotong university; key laboratory of thin film and micro fabrication; education ministry; shanghai 200030; china)
..............page:30-32
Measurement and Characterization of Nanoparticles Size
wang shu-yun(institute of physics and electronics; shandong normal university; jinan 250014; china)
..............page:37-41
Correction Algorithm for Reticle-Si-Wafer Automatic Alignment Errors
liang you-sheng1; 2; cao yi-ping1; zhou jin-mei2; xing ting-wen2(1.opto-electronics department; sichuan university; chengdu 610064; china; 2.state key laboratory of optical technologiesfor microfabrication; institute of optics and electronics; chinese academy of sciences; chengdu 610209; china)
..............page:42-47
ye jie kuai xun
..............page:48
The Study on the Absorption and Fluorescence Spectrum of HA Dispersed in Sieves(MCM-41)
gao bo-wen1; chen ping2; tang guo-qing2(1.departmant of computer science; qufu normal university; rizhao 276826; china; 2.institute of modern optics; nankai university; tianjin 300071; china)
..............page:25-29