1001-5507
2009 Issue 4
1.06 μm High Power CW Semiconductor Lasers
ren yongxiao; chen hongtai; zhang shizu; yang hongwei; hua jizhen(the 13th research institute; cetc; shijiazhuang 050051; china)
ren yongxiao; chen hongtai; zhang shizu; yang hongwei; hua jizhen(the 13th research institute; cetc; shijiazhuang 050051; china)
..............page:209-212
Quantum Effects Characterizing in Nanoelectronic Devices and Structures by Means of Shot Noise
chen huaa; du leia; zhuang yiqib; chen wenhaoa; tang donghea; li chena(a.school of technical physics; b.school of microelectronics; xidian university; xi an 710071; china)
chen huaa; du leia; zhuang yiqib; chen wenhaoa; tang donghea; li chena(a.school of technical physics; b.school of microelectronics; xidian university; xi an 710071; china)
..............page:201-208
Comparation of ~(13)C NMR Spectrum Characters of C_(20) Fullerene Isomers
zhang xiumei; wang liguang; huo xinxia; qi wenhui(school of science; jiangnan university; wuxi 214122; china)
zhang xiumei; wang liguang; huo xinxia; qi wenhui(school of science; jiangnan university; wuxi 214122; china)
..............page:217-220
Passivation,Field Plate and Heterostructure Design in GaN HFETs
xue fangshi(national key laboratory of monolithic integrated circuits and modules; nanjing electronic devices institute; nanjing 210016; china)
xue fangshi(national key laboratory of monolithic integrated circuits and modules; nanjing electronic devices institute; nanjing 210016; china)
..............page:193-200,253
Influence of Channel Strain on the Electronic Property of GaAs PHEMT Materials
bu xiazheng; wu yibin; shang yaohui; niu chenliang; zhao hui; cui qi(the 13th research institute; cetc; shijiazhuang 050051; china)
bu xiazheng; wu yibin; shang yaohui; niu chenliang; zhao hui; cui qi(the 13th research institute; cetc; shijiazhuang 050051; china)
..............page:221-225,230
Preparation and Photoluminescence Properties of Cr Doped SiC Films
zhu xiaojian; hong bo; jin chenggang; wu xuemei(jangsu key laboratory of thin film; department of physics; soochow university; suzhou 215006; china)
zhu xiaojian; hong bo; jin chenggang; wu xuemei(jangsu key laboratory of thin film; department of physics; soochow university; suzhou 215006; china)
..............page:213-216
Measurement System of Precision Stage for E-Beam Aligner
yan wei; hu song; yang yong; zhou shaolin; jiang wenbo; li yanli; qiao junxian(institute of optics and electronics; cas; chengdu 610209; china)
yan wei; hu song; yang yong; zhou shaolin; jiang wenbo; li yanli; qiao junxian(institute of optics and electronics; cas; chengdu 610209; china)
..............page:244-249
Reserch on the Etching Selectivity of GaN/SiO_2
xiao guohua; fu tieli; zheng juechen; tang lanxiang(heibei semiconductor research institute; shijiazhuang 050051; china)
xiao guohua; fu tieli; zheng juechen; tang lanxiang(heibei semiconductor research institute; shijiazhuang 050051; china)
..............page:250-253
Effects of Geometry of Piezoelectric Actuator on Coupling Characteristics of Micro Nebulizer
yang mingwei1; zhou zhaoying1(department of precision instruments; tsinghua university; beijing 100084; china)
yang mingwei1; zhou zhaoying1(department of precision instruments; tsinghua university; beijing 100084; china)
..............page:226-230
Three-Axis Micro-Force Sensor Based on a Mechanical Probe
lin qijing1; zhao yulong1; jiang zhuangde1; wang xinyao2; wang weizhong1(1.state key laboratory for manufacturing systems engineering; xi an jiaotong university; xi an 710049; china; 2.xi an shiyou university; xi an 710065; china)
lin qijing1; zhao yulong1; jiang zhuangde1; wang xinyao2; wang weizhong1(1.state key laboratory for manufacturing systems engineering; xi an jiaotong university; xi an 710049; china; 2.xi an shiyou university; xi an 710065; china)
..............page:231-235
chan pin
wang shu hua ; wang ling
wang shu hua ; wang ling
..............page:255
..............page:254-255
..............page:256
Review on Electroosmotic Pumps
bai zhuchuan1a; 2; gao yang2; 3; liu tingting1b; chen yingduan1b(1.a.school of manufacturing science and engineering; b.information engineering school; southwest university of science and technology; mianyang 621010; china; 2.institute of electronic engineering; china academy of engineering physics; mianyang 621900; china; 3.key laboratory of optoelectronic technology and system; chongqing university; chongqing 400044; china)
bai zhuchuan1a; 2; gao yang2; 3; liu tingting1b; chen yingduan1b(1.a.school of manufacturing science and engineering; b.information engineering school; southwest university of science and technology; mianyang 621010; china; 2.institute of electronic engineering; china academy of engineering physics; mianyang 621900; china; 3.key laboratory of optoelectronic technology and system; chongqing university; chongqing 400044; china)
..............page:236-243