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Semiconductor Information
1001-5507
2011 Issue 5
Reliability Study of 1-bit QCA Comparators
Huang Hongtua;Cai Lia;Peng Weidongb;Bai Pengb;Yang Xiaokuoa;Li Zhengcaoa
..............page:291-295
Structure Analysis of Thermo-Optical Induced Microfluidic Waveguide
Ding Lijuan;Li Yongqian;Guo Haiwen;Wang Ningbo
..............page:315-320
Two-Dimensional Quantum Simulation of Gate Leakage Current in Nanoscale Double Gate MOSFETs
Tang Ruia;b;Wang Haob;Chang Shenga;Hu Yuea;b;Wang Gaofenga;b
..............page:286-290
808 nm Wavelength Locked High Power Semiconductor Laser Array
An Zhenfeng1;Huang Ke1;Deng Haili2
..............page:296-299
Reliability Analysis of Power Devices by Infrared(IR) Thermography
Liang Faguo;Zhai Yuwei;Wu Aihua
..............page:338-342
Current Behavior in Electrospinning and Its Application in Morphology Control
Gu Dandana;b;Wang Lingyunb;Sun Daohengb;Xi Wenmingb
..............page:305-310
Study of Photoluminescence from CdSe Nano-Tetrapods
Zhao Lijuan1;2;Lu Aijiang1;Pang Qi2;3;Ge Weikun2;Wang Jiannong2
..............page:300-304,310
Gas Bubble Liquid Membrane Process for Preparation of Nanosized Ferrite Precursors
Zeng Neng1;2;Yang Lin1;Li Zongbao1;2;Yang Dilun1
..............page:311-314,320
Dynamic Characteristics Analysis of MEMS Capacitive Accelerometers
Xu Shujing;Yang Yongjun
..............page:321-325,332
Extraction Efficiency of GaN LEDs Improved by Low Damage ICP Etching Technique
Pan Lingfeng;Li Qi;Yi Xiaoyan;Fan Zhongchao;Wang Liangchen;Wang Junxi
..............page:333-337
guo ji shi dian
wang ling
..............page:343-344
wei na dian zi ji shu zheng gao
..............page:285
Research Development of MEMS Micro-Gyroscopes
Cheng Yuxiang;Zhang Weiping;Chen Wenyuan;Cui Feng;Liu Wu;Wu Xiaosheng
..............page:277-285